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The limited short circuit (SC) capability of GaN high-electron-mobility transistors (HEMTs) has become a critical concern for their adoption in many power applications. Recently, breakthrough SC robustness was demonstrated in a 650-V rated vertical GaN Fin-JFET with a short circuit withstanding time of over 30 µs at 400 V bus voltage (V BUS ), showing great potential for automotive powertrain and grid applications. This work presents the first study on the repetitive SC robustness of this GaN Fin-JFET at a V BUS of 400 V and 600 V. The GaN Fin-JFET survived 30,000 cycles of 400 V, 10 µs SC stresses without any degradation in device characteristics. At a 600 V V BUS , it survived over 8,000 cycles of 10 µs SC stresses before an open-circuit failure. This open-circuit failure signature allows the GaN Fin-JFET to retain its avalanche breakdown voltage and is highly desirable for system safety. Besides, an increase in gate leakage was observed during the 600 V repetitive test, which can be used as a precursor to predict device failure. As far as we know, this is the first report of an exceptional repetitive SC robustness in a power transistor at a V BUS close to its rated voltage. 

GaN high-electron-mobility transistors (HEMTs) are known to have no avalanche capability and insufficient short-circuit robustness. Recently, breakthrough avalanche and short-circuit capabilities have been experimentally demonstrated in a vertical GaN fin-channel junction-gate field-effect transistor (Fin-JFET), which shows a good promise for using GaN devices in automotive powertrains and electric grids. In particular, GaN Fin-JFETs demonstrated good short-circuit capability at avalanche breakdown voltage (BV AVA ), with a failure-to-open-circuit (FTO) signature. This work presents a comprehensive device physics-based study of the GaN Fin-JFET under short-circuit conditions, particularly at a bus voltage close to BV AVA . Mixed-mode electrothermal TCAD simulations were performed to understand the carrier dynamics, electric field distributions, and temperature profiles in the Fin-JFET under short-circuit and avalanche conditions. The results provide important physical references to understand the unique robustness of the vertical GaN Fin-JFET under the concurrence of short-circuit and avalanche as well as its desirable FTO signature. 

Biological iron-sulfur (Fe-S) clusters are essential protein prosthetic groups that promote a range of biochemical reactions. In vivo, these clusters are synthesized by specialized protein machineries involved in sulfur mobilization, cluster assembly, and cluster transfer to their target proteins. Cysteine desulfurases initiate the first step of sulfur activation and mobilization in cluster biosynthetic pathways. The reaction catalyzed by these enzymes involves the abstraction of sulfur from the amino acid l-cysteine, with concomitant formation of alanine. The presence and availability of a sulfur acceptor modulate the sulfurtransferase activity of this class of enzymes by altering their reaction profile and catalytic turnover rate. Herein, we describe two methods used to probe the reaction profile of cysteine desulfurases through quantification of alanine and sulfide production in these reactions. 

While recent efforts to catalogue Earth’s microbial diversity have focused upon surface and marine habitats, 12–20 % of Earth’s biomass is suggested to exist in the terrestrial deep subsurface, compared to ~1.8 % in the deep subseafloor. Metagenomic studies of the terrestrial deep subsurface have yielded a trove of divergent and functionally important microbiomes from a range of localities. However, a wider perspective of microbial diversity and its relationship to environmental conditions within the terrestrial deep subsurface is still required. Our meta-analysis reveals that terrestrial deep subsurface microbiota are dominated byBetaproteobacteria, GammaproteobacteriaandFirmicutes, probably as a function of the diverse metabolic strategies of these taxa. Evidence was also found for a common small consortium of prevalentBetaproteobacteriaandGammaproteobacteriaoperational taxonomic units across the localities. This implies a core terrestrial deep subsurface community, irrespective of aquifer lithology, depth and other variables, that may play an important role in colonizing and sustaining microbial habitats in the deep terrestrial subsurface. Anin silicocontamination-aware approach to analysing this dataset underscores the importance of downstream methods for assuring that robust conclusions can be reached from deep subsurface-derived sequencing data. Understanding the global panorama of microbial diversity and ecological dynamics in the deep terrestrial subsurface provides a first step towards understanding the role of microbes in global subsurface element and nutrient cycling.